| Categories | Noise Analyzer |
|---|---|
| Brand Name: | Keysight |
| Model Number: | E4727B |
| Place of Origin: | China |
| MOQ: | one |
| Price: | $10,000 |
| Packaging Details: | standard packaging |
| Delivery Time: | Delivery time for minimum order quantity ≤ 30 days |
| Payment Terms: | T/T L/C |
| Supply Ability: | 100 units/day |
| brand: | Keysight |
| model: | E4727B |
| Equipment modeling application: | Low frequency noise measurement |
| Maximum frequency: | 100 MHz |
| Measurement function:: | Flicker noise Random Telegraph Noise |
E4727B Advanced Low Frequency Noise Analyzer
Get a deeper and closer look at low frequency noise using A-LFNA
integrated with WaferPro Express, featuring data analysis, wafer
prober control, and test suite automation.
Highlights
The Advanced Low Frequency Noise Analyzer integrates with PathWave
WaferPro (WaferPro Express) to enable turnkey noise measurements as
well as measurements of DC characteristics, capacitance, and RF
S-parameters
Measure extremely low device noise, such as transistor linear
region noise, with the newly designed LNA
The state-of-the-art new LNA also allows noise measurements at very
low bias currents
High power device noise measurements even at high currents like 1A
Fast measurements with multiple averaging for increased measurement
efficiency even at high accuracy
This software module measures DC characteristics, 1/f noise, and
random telegraph noise and performs data analysis
| Feature | Description / Capability |
|---|---|
| Software Integration | Seamless integration with PathWave WaferPro (WaferPro Express) software enables turnkey solutions for noise, DC characteristics, capacitance, and RF S-parameter measurements. |
| Measurement Sensitivity | Newly designed LNA enables extremely low device noise measurement, such as transistor linear region noise and measurements at very low bias currents. |
| High-Power Capability | Capable of high-power device noise measurement under high current conditions (e.g., up to 1A). |
| Measurement Speed | Fast measurement speed improves productivity, even under high-accuracy conditions requiring extensive averaging. |
| Software Analysis Module | Dedicated software module measures DC characteristics, 1/f noise, and random telegraph noise (RTN), and performs data analysis. |
| Probing Integration | Keysight's collaboration with FormFactor enables a complete, integrated on-wafer solution with autom |
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